ICCAS OpenIR
The applications of scanning tunneling microscopy of organic pollutants
Wei, GX; Wan, LJ; Bai, CL
2004-05-01
Source PublicationPROGRESS IN CHEMISTRY
ISSN1005-281X
Volume16Issue:3Pages:376-381
AbstractThe applications of scanning tunneling microscopy (STM) of organic pollutants have been briefly introduced in this review. With part work in our laboratory, the adlayer structures, surface and interfacial reactions and dynamic processes of organic pollutants on non-metal and metal surfaces are presented. The results demonstrate that STM is a powerful technique in the study of organic pollutants.
KeywordStm Organic Pollutants Adlayer Structures Surface And Interfacial Reactions Dynamic Processes
Indexed BySCI
Language英语
WOS IDWOS:000221701500008
PublisherCHINESE ACAD SCIENCES
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Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/81856
Collection中国科学院化学研究所
Corresponding AuthorWan, LJ
AffiliationChinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China
Recommended Citation
GB/T 7714
Wei, GX,Wan, LJ,Bai, CL. The applications of scanning tunneling microscopy of organic pollutants[J]. PROGRESS IN CHEMISTRY,2004,16(3):376-381.
APA Wei, GX,Wan, LJ,&Bai, CL.(2004).The applications of scanning tunneling microscopy of organic pollutants.PROGRESS IN CHEMISTRY,16(3),376-381.
MLA Wei, GX,et al."The applications of scanning tunneling microscopy of organic pollutants".PROGRESS IN CHEMISTRY 16.3(2004):376-381.
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