ICCAS OpenIR
Effect of low energy electron exposure on ion scattering spectroscopy
Qiu, LM; Liu, F; Zhao, LZ
2003-10-01
Source PublicationCHINESE CHEMICAL LETTERS
ISSN1001-8417
Volume14Issue:10Pages:1058-1061
AbstractThe effect of low energy electron (LEE) exposure on ISS, including on the sputter peak and scatter peak as well as on ion neutralization, has been investigated for different samples. Some new results are discussed.
KeywordIon Scattering Spectroscopy (Iss) Charge Neutralization Ion neutralizatIon
Indexed BySCI
Language英语
WOS IDWOS:000185983600022
PublisherCHINESE CHEMICAL SOCIETY
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Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/81046
Collection中国科学院化学研究所
Corresponding AuthorQiu, LM
AffiliationChinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China
Recommended Citation
GB/T 7714
Qiu, LM,Liu, F,Zhao, LZ. Effect of low energy electron exposure on ion scattering spectroscopy[J]. CHINESE CHEMICAL LETTERS,2003,14(10):1058-1061.
APA Qiu, LM,Liu, F,&Zhao, LZ.(2003).Effect of low energy electron exposure on ion scattering spectroscopy.CHINESE CHEMICAL LETTERS,14(10),1058-1061.
MLA Qiu, LM,et al."Effect of low energy electron exposure on ion scattering spectroscopy".CHINESE CHEMICAL LETTERS 14.10(2003):1058-1061.
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