ICCAS OpenIR
Research for quantitative imaging X-ray photoelectron spectrometric analysis
Liu, F; Qiu, LM; Zhao, LZ
2003-09-01
Source PublicationCHINESE JOURNAL OF ANALYTICAL CHEMISTRY
ISSN0253-3820
Volume31Issue:9Pages:1082-1084
AbstractWe have explored the possibility of quantitative analysis based on the measurement of pixel intensity from the X-ray photoelectron spectrometric (XPS) image. The results for samples of AgCl and Na2S2O3 have shown, that there is a linear. relationship between pixel intensity and the acquisition time, and it is possible to do elemental or chemical state quantitative analysis by using the measured pixel intensities.
KeywordImaging X-ray Photoelectron Spectrometry Quantitative Analysis
Indexed BySCI
Language英语
WOS IDWOS:000185756200015
PublisherSCIENCE CHINA PRESS
Citation statistics
Cited Times:3[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/80384
Collection中国科学院化学研究所
Corresponding AuthorZhao, LZ
AffiliationChinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China
Recommended Citation
GB/T 7714
Liu, F,Qiu, LM,Zhao, LZ. Research for quantitative imaging X-ray photoelectron spectrometric analysis[J]. CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,2003,31(9):1082-1084.
APA Liu, F,Qiu, LM,&Zhao, LZ.(2003).Research for quantitative imaging X-ray photoelectron spectrometric analysis.CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,31(9),1082-1084.
MLA Liu, F,et al."Research for quantitative imaging X-ray photoelectron spectrometric analysis".CHINESE JOURNAL OF ANALYTICAL CHEMISTRY 31.9(2003):1082-1084.
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