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Atomic force microscopy studies on the chemical treatment of nanocrystalline porous TiO2 films
Lin, Y; Jiang, FZ; Zhang, JB; Song, YL; Jiang, L; Xiao, XR
2002-05-01
Source PublicationCHINESE CHEMICAL LETTERS
ISSN1001-8417
Volume13Issue:5Pages:484-486
AbstractAFM has been utilized to study the surface topography and the local conductivity of nanocrystalline TiO2 films. Improving the local conductivity by Ti(iso-C3H7O)(4) treatment is characterized by quantitative analysis of the simultaneous current image. The mechanism of Ti(iso C3H7O)(4) treatment is discussed.
KeywordNanocrystalline Tio2 Films Chemical Treatments Afm Topography Local Conductivity
Indexed BySCI
Language英语
WOS IDWOS:000175548400030
PublisherCHINESE CHEMICAL SOCIETY
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Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/79026
Collection中国科学院化学研究所
Corresponding AuthorLin, Y
AffiliationChinese Acad Sci, Inst Chem, Ctr Mol Sci, Beijing 100080, Peoples R China
Recommended Citation
GB/T 7714
Lin, Y,Jiang, FZ,Zhang, JB,et al. Atomic force microscopy studies on the chemical treatment of nanocrystalline porous TiO2 films[J]. CHINESE CHEMICAL LETTERS,2002,13(5):484-486.
APA Lin, Y,Jiang, FZ,Zhang, JB,Song, YL,Jiang, L,&Xiao, XR.(2002).Atomic force microscopy studies on the chemical treatment of nanocrystalline porous TiO2 films.CHINESE CHEMICAL LETTERS,13(5),484-486.
MLA Lin, Y,et al."Atomic force microscopy studies on the chemical treatment of nanocrystalline porous TiO2 films".CHINESE CHEMICAL LETTERS 13.5(2002):484-486.
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