ICCAS OpenIR
Surface characterization of atactic poly(methyl methacrylate) aggregates using atomic force microscopy
Wang, JJ; Luo, YH; Shen, DY
2002
Source PublicationPOLYMER JOURNAL
ISSN0032-3896
Volume34Issue:6Pages:471-473
KeywordAtactic Poly(Methyl Methacrylate) Dendritic Aggregates Solvent Substrate
Indexed BySCI
Language英语
WOS IDWOS:000177512100010
PublisherSOC POLYMER SCIENCE JAPAN
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Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/78932
Collection中国科学院化学研究所
Corresponding AuthorShen, DY
AffiliationChinese Acad Sci, State Key Lab Polymer Phys & Chem, Inst Chem, Beijing 100080, Peoples R China
Recommended Citation
GB/T 7714
Wang, JJ,Luo, YH,Shen, DY. Surface characterization of atactic poly(methyl methacrylate) aggregates using atomic force microscopy[J]. POLYMER JOURNAL,2002,34(6):471-473.
APA Wang, JJ,Luo, YH,&Shen, DY.(2002).Surface characterization of atactic poly(methyl methacrylate) aggregates using atomic force microscopy.POLYMER JOURNAL,34(6),471-473.
MLA Wang, JJ,et al."Surface characterization of atactic poly(methyl methacrylate) aggregates using atomic force microscopy".POLYMER JOURNAL 34.6(2002):471-473.
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