ICCAS OpenIR
Domain configuration and interface structure analysis of sol-gel-derived PZT ferroelectric thin films
Liu, D; Wang, C; Zhang, HX; Li, JW; Zhao, LC; Bai, CL
2001-08-01
Source PublicationSURFACE AND INTERFACE ANALYSIS
ISSN0142-2421
Volume32Issue:1Pages:27-31
AbstractThe domain configuration and interfacial structure of sol-gel-derived PZT thin films were evaluated using atomic force microscopy and x-ray photoelectron spectroscopy. Microstructure and ferroelectric property investigation of the PZT thin films under repeated a.c. field suggests that microcracks may be the major cause for ferroelectric fatigue. The intersection of 90 degrees domain walls, where the concentration of stress occurs, is likely to be the origin of microcracks. In addition, the entrapment of defects at domain walls, grain boundaries and/or PZT/electrode interface due to relatively lower potential energy at these sites results in an internal field with a direction opposite to the applied field, which weakens the electric field intensity in the PZT thin films. A fraction of the domains is pinned and finally results in polarization fatigue of the PZT thin films. Copyright (C) 2001 John Wiley & Sons, Ltd.
KeywordAfm Ferroelectric Thin Films Pzt Domain
Indexed ByISTP ; SCI
Language英语
WOS IDWOS:000170551800006
PublisherJOHN WILEY & SONS LTD
Citation statistics
Cited Times:10[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/77916
Collection中国科学院化学研究所
Corresponding AuthorBai, CL
Affiliation1.Chinese Acad Sci, Inst Chem, Ctr Mol Sci, Beijing 100080, Peoples R China
2.Harbin Inst Technol, Sch Sci, Harbin 150006, Peoples R China
3.Harbin Inst Technol, Sch Mat Sci, Harbin 150006, Peoples R China
Recommended Citation
GB/T 7714
Liu, D,Wang, C,Zhang, HX,et al. Domain configuration and interface structure analysis of sol-gel-derived PZT ferroelectric thin films[J]. SURFACE AND INTERFACE ANALYSIS,2001,32(1):27-31.
APA Liu, D,Wang, C,Zhang, HX,Li, JW,Zhao, LC,&Bai, CL.(2001).Domain configuration and interface structure analysis of sol-gel-derived PZT ferroelectric thin films.SURFACE AND INTERFACE ANALYSIS,32(1),27-31.
MLA Liu, D,et al."Domain configuration and interface structure analysis of sol-gel-derived PZT ferroelectric thin films".SURFACE AND INTERFACE ANALYSIS 32.1(2001):27-31.
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