ICCAS OpenIR
Recording at the nanometer scale on p-nitrobenzonitrile thin films by scanning tunneling microscopy
Shi, DX; Song, YL; Zhu, DB; Zhang, HX; Xie, SH; Pang, SJ; Gao, HJ
2001-07-18
Source PublicationADVANCED MATERIALS
ISSN0935-9648
Volume13Issue:14Pages:1103-+
AbstractA data storage density of at least 10(14) bits/cm(2) is possible using p-nitrobenzonitrile as the data storage medium and scanning tunneling microscopy (STM) as the recording method. This represents the smallest mark size among all the organic thin films studied by these authors. The figure shows a typical STM image of a recorded pattern.
Indexed BySCI
Language英语
WOS IDWOS:000170142800012
PublisherWILEY-V C H VERLAG GMBH
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Cited Times:30[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/77876
Collection中国科学院化学研究所
Corresponding AuthorGao, HJ
Affiliation1.Chinese Acad Sci, Inst Phys, Beijing Lab Vacuum Phys, Beijing 100080, Peoples R China
2.Chinese Acad Sci, Ctr Condensed Matter Phys, Beijing 100080, Peoples R China
3.Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China
Recommended Citation
GB/T 7714
Shi, DX,Song, YL,Zhu, DB,et al. Recording at the nanometer scale on p-nitrobenzonitrile thin films by scanning tunneling microscopy[J]. ADVANCED MATERIALS,2001,13(14):1103-+.
APA Shi, DX.,Song, YL.,Zhu, DB.,Zhang, HX.,Xie, SH.,...&Gao, HJ.(2001).Recording at the nanometer scale on p-nitrobenzonitrile thin films by scanning tunneling microscopy.ADVANCED MATERIALS,13(14),1103-+.
MLA Shi, DX,et al."Recording at the nanometer scale on p-nitrobenzonitrile thin films by scanning tunneling microscopy".ADVANCED MATERIALS 13.14(2001):1103-+.
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