ICCAS OpenIR
Detection of shear force with a piezoelectric bimorph cantilever for scanning near-field optical microscopy
Shang, GY; Wang, C; Lei, HN; Bai, CL
2001-08-01
Source PublicationSURFACE AND INTERFACE ANALYSIS
ISSN0142-2421
Volume32Issue:1Pages:289-292
AbstractWe present a non-optical shear force method to control the probe-sample distance for scanning near-field optical microscopy (SNOM). In this system, the detection of shear force is accomplished by attaching a tapered fibre-optic probe to a piezoelectric bimorph cantilever, which realizes the excitation and the detection simultaneously. The decrease in amplitude of the cantilever is observed when the probe approaches the sample and the shifts in resonance frequency are measured as a function of set-point. The shear force images can be obtained reliably because the set-point is >0.8. These results suggest that the system is reasonably sensitive to shear force and can be used easily for SNOM. Copyright (C) 2001 John Wiley & Sons, Ltd.
KeywordShear Force Probe-sample Distance Control Bimorph Scanning Near-field Optical Microscopy
Indexed BySCI ; ISTP
Language英语
WOS IDWOS:000170551800064
PublisherWILEY-BLACKWELL
Citation statistics
Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/77658
Collection中国科学院化学研究所
Corresponding AuthorBai, CL
Affiliation1.Chinese Acad Sci, Inst Chem, Ctr Mol Sci, Beijing 100080, Peoples R China
2.Univ Reims, Lab Microscopies Elect & Tunnel, F-51685 Reims 2, France
Recommended Citation
GB/T 7714
Shang, GY,Wang, C,Lei, HN,et al. Detection of shear force with a piezoelectric bimorph cantilever for scanning near-field optical microscopy[J]. SURFACE AND INTERFACE ANALYSIS,2001,32(1):289-292.
APA Shang, GY,Wang, C,Lei, HN,&Bai, CL.(2001).Detection of shear force with a piezoelectric bimorph cantilever for scanning near-field optical microscopy.SURFACE AND INTERFACE ANALYSIS,32(1),289-292.
MLA Shang, GY,et al."Detection of shear force with a piezoelectric bimorph cantilever for scanning near-field optical microscopy".SURFACE AND INTERFACE ANALYSIS 32.1(2001):289-292.
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