ICCAS OpenIR
Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy
Du, BY; Tsui, OKC; Zhang, QL; He, TB
2001-05-29
Source PublicationLANGMUIR
ISSN0743-7463
Volume17Issue:11Pages:3286-3291
AbstractNanometer-scale elastic moduli and yield strengths of polycarbonate (PC) and polystyrene (PS) thin films were measured with atomic force microscopy (AFM) indentation measurements. By analysis of the AFM indentation force curves with the method by Oliver and Pharr, Young's moduli of PC and PS thin films could be obtained as 2.2 +/- 0.1 and 2.6 +/- 0.1 GPa, respectively, which agree well with the literature values. By fitting Johnson's conical spherical cavity model to the measured plastic zone sizes, we obtained yield strengths of 141.2 MPa for PC thin films and 178.7 MPa for PS thin films, which are similar to2 times the values expected from the literature. We propose that it is due to the AFM indentation being asymmetric, which was not accounted for in Johnson's model. A correction factor, epsilon, of similar to0.72 was introduced to rescale the plastic zone size, whereupon good agreement between theory and experiment was achieved.
DOI10.1021/la001434a
Indexed BySCI
Language英语
WOS IDWOS:000168955300024
PublisherAMER CHEMICAL SOC
Citation statistics
Cited Times:113[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/77118
Collection中国科学院化学研究所
Corresponding AuthorTsui, OKC
Affiliation1.Hong Kong Univ Sci & Technol, Dept Phys, Kowloon, Hong Kong, Peoples R China
2.Chinese Acad Sci, Changchun Inst Appl Chem, State Key Lab Polymer Phys & Chem, Changchun 130022, Jilin, Peoples R China
Recommended Citation
GB/T 7714
Du, BY,Tsui, OKC,Zhang, QL,et al. Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy[J]. LANGMUIR,2001,17(11):3286-3291.
APA Du, BY,Tsui, OKC,Zhang, QL,&He, TB.(2001).Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy.LANGMUIR,17(11),3286-3291.
MLA Du, BY,et al."Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy".LANGMUIR 17.11(2001):3286-3291.
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