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A comparative study on morphology of block copolymer using atomic force microscopy and transmission electronics microscopy
Wang, Y; Li, YS; Song, R; Shen, JS; Long, CF
2001-11-01
Source PublicationCHEMICAL JOURNAL OF CHINESE UNIVERSITIES-CHINESE
ISSN0251-0790
Volume22Issue:11Pages:1940-1942
AbstractThe morphology of poly (styrene-ethylene/butylene-styrene) (SEBS) triblock copolymer cast from heptane and toluene was studied by combining atomic force microscopy (AFM) with transmission electronics microscopy (TEM). The quantitative agreement of the results of AFM and TEM plays a key role in determining the phase attribution for the AFM images. It is confirmed that under the moderate tapping condition, the hills in AFM height images correspond to the polystyrene phase and the valleys to the rubbery phase.
KeywordAfm Tem Microphase Separation Morphology
Indexed BySCI
Language英语
WOS IDWOS:000172272100041
PublisherHIGHER EDUCATION PRESS
Citation statistics
Cited Times:1[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/76604
Collection中国科学院化学研究所
Corresponding AuthorShen, JS
Affiliation1.Chinese Acad Sci, Inst Chem, Polymer Phys Lab, Beijing 100080, Peoples R China
2.Harbin Inst Technol, Dept Appl Chem, Harbin 150001, Peoples R China
Recommended Citation
GB/T 7714
Wang, Y,Li, YS,Song, R,et al. A comparative study on morphology of block copolymer using atomic force microscopy and transmission electronics microscopy[J]. CHEMICAL JOURNAL OF CHINESE UNIVERSITIES-CHINESE,2001,22(11):1940-1942.
APA Wang, Y,Li, YS,Song, R,Shen, JS,&Long, CF.(2001).A comparative study on morphology of block copolymer using atomic force microscopy and transmission electronics microscopy.CHEMICAL JOURNAL OF CHINESE UNIVERSITIES-CHINESE,22(11),1940-1942.
MLA Wang, Y,et al."A comparative study on morphology of block copolymer using atomic force microscopy and transmission electronics microscopy".CHEMICAL JOURNAL OF CHINESE UNIVERSITIES-CHINESE 22.11(2001):1940-1942.
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