ICCAS OpenIR
Enhancement of resolution of DNA on silylated mica using atomic force microscopy
Tang, J; Li, JW; Wang, C; Bai, CL
2000-07-01
Source PublicationJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN1071-1023
Volume18Issue:4Pages:1858-1860
AbstractIt is demonstrated that the mica surface covered with a nanometer-thick, well connected silane film can appreciably improve the lateral resolution of DNA molecules in comparison with that on bare mica using atomic force microscopy. A typical value width of 4 nm can be obtained. We propose that the nanometer dimensioned porous surface provides an approach to eliminate the hydrated salt layer associated with the condensation of DNA strands, and leads to the enhancement of lateral resolution. (C) 2000 American Vacuum Society. [S0733-211X(00)02904-8].
Indexed BySCI
Language英语
WOS IDWOS:000088834400007
PublisherA V S AMER INST PHYSICS
Citation statistics
Cited Times:13[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/75902
Collection中国科学院化学研究所
Corresponding AuthorBai, CL
AffiliationChinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China
Recommended Citation
GB/T 7714
Tang, J,Li, JW,Wang, C,et al. Enhancement of resolution of DNA on silylated mica using atomic force microscopy[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,2000,18(4):1858-1860.
APA Tang, J,Li, JW,Wang, C,&Bai, CL.(2000).Enhancement of resolution of DNA on silylated mica using atomic force microscopy.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,18(4),1858-1860.
MLA Tang, J,et al."Enhancement of resolution of DNA on silylated mica using atomic force microscopy".JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 18.4(2000):1858-1860.
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