ICCAS OpenIR
A new method for fractal dimension determination by STM at nanometer scale
Li, QK; Zhang, Y; Chu, WY; Wang, C; Bai, CL
1999-03-01
Source PublicationJOURNAL OF UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING
ISSN1005-8850
Volume6Issue:1Pages:64-68
AbstractA new method for determining the fractal dimension by STM at nanometer scale has been proposed. Weierstrass-Mandelbrot fractal curves wen: used to verify the accuracy and reliability. The Computer simulation showed that the fractal dimension obtained with this method generally outran the traditional yard method. The new method has been applied to the fractal dimension determination of the fractures of Ti3Al and Ti-24Al-11Nb alloys. The results show that the fractal dimension of Ti-24Al-11Nb alloy is higher than that of Ti3Al, and it varies with the crack extending orientation.
KeywordFractal Dimension Stm Nanometer Scale Ti-al Alloy
Indexed BySCI
Language英语
WOS IDWOS:000084045300017
PublisherJOURNAL OF UNIV OF SCIENCE AND TECHNOLOGY BEIJING
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Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/75330
Collection中国科学院化学研究所
Corresponding AuthorLi, QK
Affiliation1.Univ Sci & Technol Beijing, Appl Sci Sch, Beijing 100083, Peoples R China
2.Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China
Recommended Citation
GB/T 7714
Li, QK,Zhang, Y,Chu, WY,et al. A new method for fractal dimension determination by STM at nanometer scale[J]. JOURNAL OF UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING,1999,6(1):64-68.
APA Li, QK,Zhang, Y,Chu, WY,Wang, C,&Bai, CL.(1999).A new method for fractal dimension determination by STM at nanometer scale.JOURNAL OF UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING,6(1),64-68.
MLA Li, QK,et al."A new method for fractal dimension determination by STM at nanometer scale".JOURNAL OF UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING 6.1(1999):64-68.
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