ICCAS OpenIR
Studies on the rectifying effect of the heterojunction between porous silicon and water-soluble copolymer of polyaniline
Fan, JH; Wan, MX; Zhu, DB
1998-06-15
Source PublicationSYNTHETIC METALS
ISSN0379-6779
Volume95Issue:2Pages:119-124
AbstractRectifying diodes of the heterojunction between porous silicon (PS) and water-soluble copolymer of polyaniline (PAOABSA) with the rectifying ratio of 5.0 x 10(4) at +/- 3 V bias were fabricated and the rectifying characteristics of the heterojunction diode, Al/PS-PAOABSA/Au cell, were measured as a function of the sulfonated degree and thickness of the PAOABSA copolymer films, as well as the oxidation of silicon exposed to air. It was found that decreasing the sulfonated degree and thickness of the PAOABSA copolymer films is favorable for enhancement of rectifying characteristics of the heterojunction diodes. Moreover,it was noted that the oxidation of silicon exposed to air is harmful for the rectifying effect of the heterojunction diodes. (C) 1998 Elsevier Science S.A. All rights reserved.
KeywordRectifying Effect Heterojunctions Water-soluble Copolymer Of Polyaniline
Indexed BySCI
Language英语
WOS IDWOS:000074680200007
PublisherELSEVIER SCIENCE SA
Citation statistics
Cited Times:14[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/74772
Collection中国科学院化学研究所
Corresponding AuthorWan, MX
AffiliationChinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China
Recommended Citation
GB/T 7714
Fan, JH,Wan, MX,Zhu, DB. Studies on the rectifying effect of the heterojunction between porous silicon and water-soluble copolymer of polyaniline[J]. SYNTHETIC METALS,1998,95(2):119-124.
APA Fan, JH,Wan, MX,&Zhu, DB.(1998).Studies on the rectifying effect of the heterojunction between porous silicon and water-soluble copolymer of polyaniline.SYNTHETIC METALS,95(2),119-124.
MLA Fan, JH,et al."Studies on the rectifying effect of the heterojunction between porous silicon and water-soluble copolymer of polyaniline".SYNTHETIC METALS 95.2(1998):119-124.
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