ICCAS OpenIR
Studies on origin of stress yield peak for amorphous poly(ethylene terephthalate) films.
Wang, Y; Shen, DY; Qian, RY
1998-08-23
Source PublicationABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY
ISSN0065-7727
Volume216Pages:U100-U101
Indexed BySCI
Language英语
WOS IDWOS:000075235100337
PublisherAMER CHEMICAL SOC
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Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/74404
Collection中国科学院化学研究所
Affiliation1.Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China
2.Univ Massachusetts, Dept Polymer Sci & Engn, Amherst, MA 01003 USA
Recommended Citation
GB/T 7714
Wang, Y,Shen, DY,Qian, RY. Studies on origin of stress yield peak for amorphous poly(ethylene terephthalate) films.[J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY,1998,216:U100-U101.
APA Wang, Y,Shen, DY,&Qian, RY.(1998).Studies on origin of stress yield peak for amorphous poly(ethylene terephthalate) films..ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY,216,U100-U101.
MLA Wang, Y,et al."Studies on origin of stress yield peak for amorphous poly(ethylene terephthalate) films.".ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY 216(1998):U100-U101.
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