ICCAS OpenIR
Characterization and electrical switching properties of Cu-tetracyanoquinodimethane films formed under different conditions
Sun, SQ; Xu, XY; Wu, PJ; Zhu, DB
1998-05-01
Source PublicationJOURNAL OF MATERIALS SCIENCE LETTERS
ISSN0261-8028
Volume17Issue:9Pages:719-721
Indexed BySCI
Language英语
WOS IDWOS:000078835900005
PublisherKLUWER ACADEMIC PUBL
Citation statistics
Cited Times:25[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/74344
Collection中国科学院化学研究所
Corresponding AuthorSun, SQ
Affiliation1.Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China
2.Capital Univ Med Sci, Basic Sch Med Sci, Beijing 100054, Peoples R China
Recommended Citation
GB/T 7714
Sun, SQ,Xu, XY,Wu, PJ,et al. Characterization and electrical switching properties of Cu-tetracyanoquinodimethane films formed under different conditions[J]. JOURNAL OF MATERIALS SCIENCE LETTERS,1998,17(9):719-721.
APA Sun, SQ,Xu, XY,Wu, PJ,&Zhu, DB.(1998).Characterization and electrical switching properties of Cu-tetracyanoquinodimethane films formed under different conditions.JOURNAL OF MATERIALS SCIENCE LETTERS,17(9),719-721.
MLA Sun, SQ,et al."Characterization and electrical switching properties of Cu-tetracyanoquinodimethane films formed under different conditions".JOURNAL OF MATERIALS SCIENCE LETTERS 17.9(1998):719-721.
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