ICCAS OpenIR
AFM studies of HTDIOO monomolecular layer LB films
Tian, F; Wang, C; Bai, CL; Xu, Y
1998-04-01
Source PublicationACTA PHYSICO-CHIMICA SINICA
ISSN1000-6818
Volume14Issue:4Pages:293-298
AbstractThe structures of HTDIOO molecular monolayer and multilayer LB films have been observed by atomic force microscopy(AFM) in molecular and nanometer scales. It demonstrates that large AFM probe tip force could damage the structure of HTDIOO LB films. Moreover, there is an ordered structure in HTDIOO monolayer LB film. While the HTDIOO molecules aggragate and form domains in multilayer LB film, which could be associated with the stripe magnetic structure formed in multilayer HTDIOO LB films observed with magnetic force microscopy (MFM).
KeywordAtomic Force Microscopy Lb Film
DOI10.3866/PKU.WHXB19980402
Indexed BySCI
Language英语
WOS IDWOS:000074858600002
PublisherPEKING UNIV PRESS
Citation statistics
Cited Times:1[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/74286
Collection中国科学院化学研究所
Corresponding AuthorBai, CL
AffiliationChinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China
Recommended Citation
GB/T 7714
Tian, F,Wang, C,Bai, CL,et al. AFM studies of HTDIOO monomolecular layer LB films[J]. ACTA PHYSICO-CHIMICA SINICA,1998,14(4):293-298.
APA Tian, F,Wang, C,Bai, CL,&Xu, Y.(1998).AFM studies of HTDIOO monomolecular layer LB films.ACTA PHYSICO-CHIMICA SINICA,14(4),293-298.
MLA Tian, F,et al."AFM studies of HTDIOO monomolecular layer LB films".ACTA PHYSICO-CHIMICA SINICA 14.4(1998):293-298.
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