ICCAS OpenIR
Electrical Characteristics of High-Performance ZnO Field-Effect Transistors Prepared by Ultrasonic Spray Pyrolysis Technique
Yi Ming-Dong1,2,3; Xie Ling-Hai1,2; Liu Yu-Yu1,2; Dai Yan-Feng3; Huang Jin-Ying3
2011
Source PublicationCHINESE PHYSICS LETTERS
ISSN0256-307X
Volume28Issue:1
AbstractWe have fabricated ZnO-based thin-film transistors (TFTs) by low-cost ultrasonic spray pyrolysis. The devices exhibit high saturation mobility of about 0.6 cm(2)/Vs and on-off current ratio of 10(5). The electrical characteristics of ZnO-based TFTs show that ultrasonic spray pyrolysis technique can be used as a promising approach to attain high-performance electronic devices. Furthermore, the deposition techniques make the operating process attractive for flexible electronics.
DOI10.1088/0256-307X/28/1/017302
Indexed BySCI
Language英语
WOS IDWOS:000285966900049
PublisherIOP PUBLISHING LTD
Citation statistics
Cited Times:7[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/71280
Collection中国科学院化学研究所
Corresponding AuthorYi Ming-Dong
Affiliation1.Nanjing Univ Posts & Telecommun, Key Lab Organ Elect & Informat Displays, Nanjing 210046, Peoples R China
2.Nanjing Univ Posts & Telecommun, Inst Adv Mat, Nanjing 210046, Peoples R China
3.Chinese Acad Sci, Changchun Inst Appl Chem, State Key Lab Polymer Phys & Chem, Grad Sch, Changchun 130022, Peoples R China
Recommended Citation
GB/T 7714
Yi Ming-Dong,Xie Ling-Hai,Liu Yu-Yu,et al. Electrical Characteristics of High-Performance ZnO Field-Effect Transistors Prepared by Ultrasonic Spray Pyrolysis Technique[J]. CHINESE PHYSICS LETTERS,2011,28(1).
APA Yi Ming-Dong,Xie Ling-Hai,Liu Yu-Yu,Dai Yan-Feng,&Huang Jin-Ying.(2011).Electrical Characteristics of High-Performance ZnO Field-Effect Transistors Prepared by Ultrasonic Spray Pyrolysis Technique.CHINESE PHYSICS LETTERS,28(1).
MLA Yi Ming-Dong,et al."Electrical Characteristics of High-Performance ZnO Field-Effect Transistors Prepared by Ultrasonic Spray Pyrolysis Technique".CHINESE PHYSICS LETTERS 28.1(2011).
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