ICCAS OpenIR
Wetting Behavior at Micro-/Nanoscales: Direct Imaging of a Microscopic Water/Air/Solid Three-Phase Interface
Chen, Peipei1,3; Chen, Long1; Han, Dong1; Zhai, Jin2; Zheng, Yongmei1; Jiang, Lei2
2009-04-20
Source PublicationSMALL
ISSN1613-6810
Volume5Issue:8Pages:908-912
KeywordAfm Force Curves Imaging Lotus Leaves Wettability
DOI10.1002/smll.200801152
Indexed BySCI
Language英语
WOS IDWOS:000265868200002
PublisherWILEY-V C H VERLAG GMBH
Citation statistics
Cited Times:36[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/68146
Collection中国科学院化学研究所
Corresponding AuthorHan, Dong
Affiliation1.Natl Ctr Nanosci & Technol, Beijing 100190, Peoples R China
2.Chinese Acad Sci, Ctr Mol Sci, Inst Chem, Beijing 100190, Peoples R China
3.Chinese Acad Sci, Grad Sch, Beijing 100864, Peoples R China
Recommended Citation
GB/T 7714
Chen, Peipei,Chen, Long,Han, Dong,et al. Wetting Behavior at Micro-/Nanoscales: Direct Imaging of a Microscopic Water/Air/Solid Three-Phase Interface[J]. SMALL,2009,5(8):908-912.
APA Chen, Peipei,Chen, Long,Han, Dong,Zhai, Jin,Zheng, Yongmei,&Jiang, Lei.(2009).Wetting Behavior at Micro-/Nanoscales: Direct Imaging of a Microscopic Water/Air/Solid Three-Phase Interface.SMALL,5(8),908-912.
MLA Chen, Peipei,et al."Wetting Behavior at Micro-/Nanoscales: Direct Imaging of a Microscopic Water/Air/Solid Three-Phase Interface".SMALL 5.8(2009):908-912.
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