ICCAS OpenIR
Blind deconvolution of x-ray diffraction profiles by using high-order statistics
Yuan, Jinghe1,2
2009-07-01
Source PublicationOPTICAL ENGINEERING
ISSN0091-3286
Volume48Issue:7
AbstractA high-order statistical-based, blind deconvolution algorithm is proposed for x-ray powder diffraction profiles. Maximizing the kurtosis amplitude of the deconvolved data ensures that only the data with maximized kurtosis amplitude is extracted. The ill-posed nature of deconvolution is, thus, bypassed. Using simulation and experiments, this method is seen to be very robust with respect to noise. The profile resolution is enhanced considerably, and the deconvolved profile fits the pseudo-Voigt profile nicely. However, noise is enhanced in the deconvolved data, so the algorithm may be invalid for experimental data with low signal-to-noise. (C) 2009 Society of Photo-Optical Instrumentation Engineers. [DOI: 10.1117/1.3159868]
KeywordX-ray Diffraction Blind Deconvolution High-order Statistics
DOI10.1117/1.3159868
Indexed BySCI
Language英语
WOS IDWOS:000268489400026
PublisherSPIE-SOC PHOTOPTICAL INSTRUMENTATION ENGINEERS
Citation statistics
Cited Times:3[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/67232
Collection中国科学院化学研究所
Corresponding AuthorYuan, Jinghe
Affiliation1.Yantai Univ, Inst Sci & Technol Optoelect Informat, Yantai 264005, Peoples R China
2.Chinese Acad Sci, Inst Chem, Key Lab Mol Nanostruct & Nanotechnol, Beijing 100190, Peoples R China
Recommended Citation
GB/T 7714
Yuan, Jinghe. Blind deconvolution of x-ray diffraction profiles by using high-order statistics[J]. OPTICAL ENGINEERING,2009,48(7).
APA Yuan, Jinghe.(2009).Blind deconvolution of x-ray diffraction profiles by using high-order statistics.OPTICAL ENGINEERING,48(7).
MLA Yuan, Jinghe."Blind deconvolution of x-ray diffraction profiles by using high-order statistics".OPTICAL ENGINEERING 48.7(2009).
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