ICCAS OpenIR
Particle-based chemical oscillation as a function of depth in latex films using gas cluster ion beam secondary ion mass spectrometry profiling
Pacholski, Michaeleen L.1; Qu, Zhaohui2; Ouyang, Wuye2; Zheng, Zhibo3; Wang, Rong3
2018-05-01
Source PublicationJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN1071-1023
Volume36Issue:3
AbstractDepth profiles of thin, latex films using gas cluster ion beam (GCIB) secondary ion mass spectrometry (SIMS) show an oscillation of surfactants and polymer signal that is related to the organization of the particles in the film as layers. These results demonstrate the application of GCIB-SIMS to the distribution of water soluble species with molecular sensitivity, which has implications to film performance in areas of adhesion, appearance, and cohesion. Specifically, surfactant species were found at the highest concentrations at the air interface, decreasing through the top few particle layers to a steady state, whereas salt-rich species (sulfates, oligomers) were found at every particle boundary with a high concentration at the substrate interface. Published by the AVS.
DOI10.1116/1.5024044
Indexed BySCI
Language英语
WOS IDWOS:000432972200005
PublisherA V S AMER INST PHYSICS
Citation statistics
Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/42868
Collection中国科学院化学研究所
Corresponding AuthorPacholski, Michaeleen L.
Affiliation1.Dow Chem Co USA, 400 Arcola Rd, Collegeville, PA 19426 USA
2.Rohm & Haas China Holding Co Ltd, 936 Zhangheng Rd,Zhangjiang Hitech Pk, Shanghai 201203, Peoples R China
3.Peking Univ, Beijing Natl Lab Mol Sci, Coll Chem & Mol Engn, Key Lab Polymer Chem & Phys,Minist Educ, Beijing 100871, Peoples R China
Recommended Citation
GB/T 7714
Pacholski, Michaeleen L.,Qu, Zhaohui,Ouyang, Wuye,et al. Particle-based chemical oscillation as a function of depth in latex films using gas cluster ion beam secondary ion mass spectrometry profiling[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,2018,36(3).
APA Pacholski, Michaeleen L.,Qu, Zhaohui,Ouyang, Wuye,Zheng, Zhibo,&Wang, Rong.(2018).Particle-based chemical oscillation as a function of depth in latex films using gas cluster ion beam secondary ion mass spectrometry profiling.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,36(3).
MLA Pacholski, Michaeleen L.,et al."Particle-based chemical oscillation as a function of depth in latex films using gas cluster ion beam secondary ion mass spectrometry profiling".JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 36.3(2018).
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Pacholski, Michaeleen L.]'s Articles
[Qu, Zhaohui]'s Articles
[Ouyang, Wuye]'s Articles
Baidu academic
Similar articles in Baidu academic
[Pacholski, Michaeleen L.]'s Articles
[Qu, Zhaohui]'s Articles
[Ouyang, Wuye]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Pacholski, Michaeleen L.]'s Articles
[Qu, Zhaohui]'s Articles
[Ouyang, Wuye]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.