ICCAS OpenIR
Direct Observation of the Dipole-Induced Energetic Disorder in Rubrene Single-Crystal Transistors by Scanning Kelvin Probe Microscopy
Hu, Yuanyuan1; Jiang, Lang2; Chen, Qinjun1; Guo, Jing1; Chen, Zhuojun1
2018-06-07
Source PublicationJOURNAL OF PHYSICAL CHEMISTRY LETTERS
ISSN1948-7185
Volume9Issue:11Pages:2869-2873
AbstractIt is commonly accepted that gate dielectric dipoles can induce energetic disorder in organic field-effect transistors. However, convincing experimental evidence that directly demonstrate this effect are still in lack. In this work, we present a combined experimental and theoretical study to reveal this effect. We have investigated the temperature-dependent mobility of two rubrene single crystal transistors with different polymer dielectrics. Model fittings of the data indicate there is higher energetic disorder in the device on dielectric with larger permittivity. Scanning Kelvin probe microscopy was then employed to directly characterize the density of tail states, which is correlated with energetic disorder, in the devices. The results further confirm that dielectric dipoles can increase energetic disorder in organic semiconductors.
DOI10.1021/acs.jpclett.8b01274
Indexed BySCI
Language英语
WOS IDWOS:000435026100025
PublisherAMER CHEMICAL SOC
Citation statistics
Cited Times:5[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.iccas.ac.cn/handle/121111/42592
Collection中国科学院化学研究所
Corresponding AuthorHu, Yuanyuan
Affiliation1.Hunan Univ, Sch Phys & Elect, Minist Educ, Key Lab Micronano Optoelect Devices, Changsha 410082, Hunan, Peoples R China
2.Chinese Acad Sci, Beijing Natl Lab Mol Sci, Inst Chem, Key Lab Organ Solids, Beijing 100190, Peoples R China
Recommended Citation
GB/T 7714
Hu, Yuanyuan,Jiang, Lang,Chen, Qinjun,et al. Direct Observation of the Dipole-Induced Energetic Disorder in Rubrene Single-Crystal Transistors by Scanning Kelvin Probe Microscopy[J]. JOURNAL OF PHYSICAL CHEMISTRY LETTERS,2018,9(11):2869-2873.
APA Hu, Yuanyuan,Jiang, Lang,Chen, Qinjun,Guo, Jing,&Chen, Zhuojun.(2018).Direct Observation of the Dipole-Induced Energetic Disorder in Rubrene Single-Crystal Transistors by Scanning Kelvin Probe Microscopy.JOURNAL OF PHYSICAL CHEMISTRY LETTERS,9(11),2869-2873.
MLA Hu, Yuanyuan,et al."Direct Observation of the Dipole-Induced Energetic Disorder in Rubrene Single-Crystal Transistors by Scanning Kelvin Probe Microscopy".JOURNAL OF PHYSICAL CHEMISTRY LETTERS 9.11(2018):2869-2873.
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