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题名: In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode
作者: Liu Xing-Rui1; Yan Hui-Juan1; Wang Dong1; Wan Li-Jun1
关键词: Si anode ; Solid electrolyte interphase ; In situ atomic force microscopy
刊名: ACTA PHYSICO-CHIMICA SINICA
发表日期: 2016-01-15
卷: 32, 期:1, 页:283-289
收录类别: SCI
英文摘要: The interfacial morphology of a single crystal Si wafer anode during the first dischargingcharging cycle was investigated using in situ atomic force microscopy (AFM). The solidelectrolyte interphase (SEI) began to grow from 1.5 V, developing rapidly between 1.25 and 1.0 V, and slowed down after 0.6 V. The morphology suggested that the SEI had a layered structure. The outer layer of SEI was soft and easy to be scraped off during the AFM tip scanning. The underlayer of SEI had granular features. During the lithiation process, the Si surface became grainy because of the insertion of Li ions. After the first cycle, the Si surface was completely covered by inhomogeneous SEI. The thickness of the SEI was approximately 10-40 nm.
语种: 英语
内容类型: 期刊论文
URI标识: http://ir.iccas.ac.cn/handle/121111/35864
Appears in Collections:分子纳米结构与纳米技术实验室_期刊论文

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作者单位: 1.Chinese Acad Sci, Inst Chem, Beijing Natl Lab Mol Sci, CAS Key Lab Mol Nanostruct & Nanotechnol, Beijing 100190, Peoples R China
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