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题名: Scanning Kelvin Probe Microscopy Investigation of the Role of Minority Carriers on the Switching Characteristics of Organic Field-Effect Transistors
作者: Hu, Yuanyuan1; Pecunia, Vincenzo1; Jiang, Lang1; Di, Chong-An2; Gao, Xike3; Sirringhaus, Henning1
刊名: ADVANCED MATERIALS
发表日期: 2016-06-15
卷: 28, 期:23, 页:4713-4719
收录类别: SCI
英文摘要: A method based on scanning Kelvin probe microscopy is developed to probe the effects of minority carriers on the switching characteristics of organic field-effect transistors. The mobility of the minority carriers is extracted and the role they play in screening of the gate potential in the OFF state and in recombination of trapped majority carriers trapped after an ON state is understood.
语种: 英语
内容类型: 期刊论文
URI标识: http://ir.iccas.ac.cn/handle/121111/35785
Appears in Collections:有机固体实验室_期刊论文

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作者单位: 1.Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England
2.Chinese Acad Sci, Inst Chem, Key Lab Organ Solids, Beijing Natl Lab Mol Sci, Beijing 100190, Peoples R China
3.Chinese Acad Sci, Shanghai Inst Organ Chem, Mat Sci Lab, 345 Lingling Lu, Shanghai 200032, Peoples R China
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